WS-2005 type coating adhesion automatic scratch tester
WS-2005-type coating adhesion automatic scratch instrument is the use of acoustic emission and friction detection technology, the surface of the material to detect a variety of hard or soft coating and substrate bonding strength. Machinery industry Standard (jb/t85541997).
WS-2005 Type coating adhesion automaticScratches instrumentis the use of acoustic emission and friction detection technology to detect the material surface of various hard or soft coating and substrate bonding strength. Machinery industry Standard (jb/t85541997).
WS-2005 type coating adhesion automatic scratch instrument measurement mode:
1。 Acoustic emission measurement mode 2。 Frictional force measurement mode 3。 Static pressure measurement mode
4. Constant load Measurement mode 5. Conductivity measurement mode (optional)
Technical specification of WS-2005 type coating adhesion automatic scratch tester
Test Load Range: 0~200n
Coating thickness detection range: 0.2~150μm
Scratches speed: 1~10mm/min
奔驰彩票官网Load Rate: 10~100n/min
Scratch Length Range: 2~6mm
Scratches reciprocating times: 1~100
奔驰彩票官网Standard pressure head: Diamond (cone angle 120°, tip radius r=0.2)
Sample table X-Axis adjustable: ±25mm
The y-axis of the sample table can be adjustable: ±25mm
Sample Table z-axis lifting height adjustable: 0~80mm
Instrument host size (mm): 360*270*380
Instrument mainframe Weight (KG): 15
Table Size (mm): long x Width x high 1500x750x800
奔驰彩票官网WS-2005-type coating adhesion automatic scratch tester is a computer-controlled multifunctional tribological performance tester, which can be used for coating samples or small parts of the film base bonding strength and a variety of friction and wear properties of the test. The complex scratch tester is equipped with a variety of pattern scratch test functions, with sound emission monitoring. In addition, the system can be equipped with optical microscope lens and camera, as well as the measurement and analysis software to enhance the detection and analysis function of the tester.